EDS with Slim-line Technology




Once again Bruker sets standards in performance and functionality in energy-dispersive spectrometry for the scanning electron microscope. The new generation of QUANTAX EDS features the XFlash® 6 detector series with active areas from 10 to 100 mm2.

Generation 6 provides the hardware and software technology to deliver the fastest and most reliable results:

  • Save time – new slim-line technology detectors, large area SDDs, and high performance pulse processing get the job done faster
  • ƒƒSave effort – motorized detector movement and light weight design make detector handling easier
  • ƒƒGain more precision – best energy resolution provides the highest quality spectra for precise analysis
  • ƒƒGain more reliability – the world’s most comprehensive atomic database ensures most dependable low energy peak identification
  • ƒƒGain more accuracy – the most sophisticated algorithms for quantification and the unique combination of standardless and standard-based methods provide highest accuracy results

Technical Details

Wide range of detector sizes

  • 10, 30, 60 and 100 mm2 area detectors offer ideal solutions for microanalysis and nano-analysis

Best energy resolution for light element and low energy analysis

  • ƒƒ121 eV limited edition
  • ƒƒ123 eV ultimate
  • ƒƒ126 eV premium
  • ƒƒ129 eV standard
  • ƒƒAll resolutions specified exceeding ISO 15632:2002 requirements

Ultra high throughput for fastest measurements

  • ƒƒNew signal processing unit with hybrid technology
  • ƒƒOver 1,500 kcps input count rate
  • Up to 600 kcps output count rate

Slim-line detector technology for even more counts and lower beam currents

  • ƒƒShortest detector to sample distances for maximum solid angle in SEM, FIB-SEM and microprobe

Compact design and low weight

  • ƒƒHigh precision slider with fully integrated motor for precise positioning
  • Improved heat sink geometry for stable measurement conditions
  • Maximum detector weight of 3.75 kg
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